Measuring apparatus

Details Measuring apparatus Measuring apparatus

1981-12-08

1983-11-29

Sikes, William L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356352, G01B 902

Patent

active

044178158

ABSTRACT:
Apparatus for measuring or detecting changes in a variety of physical or chemical parameters comprises an interferometer having a transmission frequency variable over a range of frequencies as a function of changes in the parameter. The transmission frequency is measured by beating with a coherent reference frequency.

REFERENCES:
patent: 4355898 (1982-10-01), Dakin
Henderson, "Interferometry of the E Corona", Applied Optics, vol. 9, No. 12, pp. 2635-2642, Dec. 1970.

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