Thermal measuring and testing – Determination of inherent thermal property
Reexamination Certificate
2007-08-28
2007-08-28
Gutierrez, Diego (Department: 2859)
Thermal measuring and testing
Determination of inherent thermal property
C374S141000
Reexamination Certificate
active
11232909
ABSTRACT:
There is described a method and sub-circuit to measure temperature coefficients (coefficient of variation of a measurable parameter of the component), by using a thermally-isolated silicon micro-platform with a mass of mono-crystalline silicon suspended from it. The particular effectiveness of the measurement of temperature coefficient(s) stems from the influence of the mono-crystalline silicon mass in maintaining a substantially uniform temperature throughout the micro-platform. The measurement of temperature coefficient can be an absolute temperature coefficient of one or more components, or can be a relative temperature coefficient of two components, or can be relative temperature coefficients between more than two components.
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Grudin Oleg
Landsberger Leslie M.
Gutierrez Diego
Jagan Mirellys
Microbridge Technologies Inc.
Ogilvy Renault LLP
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