Optics: measuring and testing – Of light reflection
Reexamination Certificate
2011-05-17
2011-05-17
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
Of light reflection
C356S402000, C356S448000
Reexamination Certificate
active
07944561
ABSTRACT:
An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
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Nisper Jon Kenneth
Pawlanta Brett Allen
Richardson Thomas M.
Rood Patrick S.
Teunis Brian Dale
Chowdhury Tarifur
McCarter & English LLP
Stock, Jr. Gordon J
X-Rite, Inc.
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