Measuring a characteristic of a transfer circuit

Details Measuring a characteristic of a transfer circuit Measuring a characteristic of a transfer circuit

2005-12-14

2008-12-23

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

C356S218000, C356S943000

Reexamination Certificate

active

07469196

ABSTRACT:
A measuring apparatus that measures a characteristic of a transfer circuit includes: an electrical signal sending section that transmits a sending signal; a current to light converting section that converts the sending signal into an optical signal; an optical signal transmitting section that transmits the optical signal; a photo-electric converting circuit tat converts the optical signal into an electrical signal; a level measuring section that compares the intensity of the electrical signal output from said photo-electric converting circuit and a predetermined reference level to detect a data value of the electrical signal; an electrical signal receiving section that detects a data value of the electrical signal; and a timing controlling section that controls latch timing at which said electrical signal receiving section detects the data value of the electrical signal.

REFERENCES:
patent: 4812910 (1989-03-01), Komiya
patent: 6101122 (2000-08-01), Hirota
patent: 6496288 (2002-12-01), Yamane et al.
patent: 6501288 (2002-12-01), Wilsher
patent: 6782202 (2004-08-01), Arita et al.
patent: 6911851 (2005-06-01), Sekiguchi et al.
patent: 2003/0161637 (2003-08-01), Yamamoto et al.
patent: 2005/0270412 (2005-12-01), Kamon et al.
patent: 2-137550 (1990-05-01), None
patent: 6-120898 (1994-04-01), None
patent: 2000-155349 (2000-06-01), None
patent: WO-2004/095736 (2004-11-01), None
Karabegov et al., ‘Calculation of Functional Characteristics of Optical Compensators in Photometeric Analyzers’, Oct. 1966, UDC Publication, pp. 1333-1337.
Kobayashi et al.,‘Automatic Frequency Control in Semiconductor Laser and Optical Amplifier’, Jun. 1983, IEEE Publication, vol. 1, No. 2, pp. 394-402.
Patent Abstracts of Japan, Publication No. 2000-155349, Publication Date: Jun. 6, 2000, 2 pages.
Japanese PCT Search Report for PCT /JP2006/324817 dated Jan. 23, 2007, and English translation thereof, 10 pages.

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