Data processing: artificial intelligence – Knowledge processing system – Creation or modification
Reexamination Certificate
2005-09-13
2005-09-13
Davis, George (Department: 2121)
Data processing: artificial intelligence
Knowledge processing system
Creation or modification
C717S101000
Reexamination Certificate
active
06944606
ABSTRACT:
A measurements expert system and method for generating high-performance measurements software drivers. The measurements expert system is able to interpret a customer's measurement task specification (MTS) specifying a measurement task, explore possible solution paths, and generate a solution, e.g., a run-time specification (RTS), optimized for the customer's measurement system. The expert system includes programs for analyzing and validating a received MTS, and a plurality of measurements experts which are operable to analyze all or part of the MTS and populate complete or partial RTSs. The partial RTSs are iteratively populated by other experts to form complete RTSs. Competing RTSs may be assessed and a final RTS selected based upon user preferences. The final RTS is useable to configure one or more measurement devices according to the RTS, and to generate a run-time which is executable to perform the specified measurement task using the one or more measurement devices.
REFERENCES:
patent: 4812996 (1989-03-01), Stubbs
patent: 4868785 (1989-09-01), Jordan et al.
patent: 4884228 (1989-11-01), Stanley et al.
patent: 5133045 (1992-07-01), Gaither et al.
patent: 5136705 (1992-08-01), Stubbs et al.
patent: 5155836 (1992-10-01), Jordan et al.
patent: 5394549 (1995-02-01), Stringfellow et al.
patent: 5481741 (1996-01-01), McKaskle et al.
patent: 5630164 (1997-05-01), Williams et al.
patent: 5812394 (1998-09-01), Lewis et al.
patent: 5926775 (1999-07-01), Brumley et al.
patent: 5991537 (1999-11-01), McKeon et al.
patent: 6006267 (1999-12-01), Nguyen et al.
patent: 6067584 (2000-05-01), Hayles et al.
patent: 6096094 (2000-08-01), Kay et al.
patent: 6098028 (2000-08-01), Zwan et al.
Jose Luis Gordillo, “LE: A Hight Level Language for Specification Vision Verification Tasks”, Proceedings of the 1991 IEEE International Conference on Robotics and Automation, Apr. 1991.
Brumley Jonathan
Levy Jack
Schmit Geoffrey
Schwan Brent
Davis George
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
National Instruments Corporation
Williams Mark S.
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