Measurement system utilizing a sensor formed on a silicon on ins

Details Measurement system utilizing a sensor formed on a silicon on ins Measurement system utilizing a sensor formed on a silicon on ins

1999-03-29

2000-05-23

Oen, William

Measuring and testing

Fluid pressure gauge

Electrical

G01L 900, G01L 916

Patent

active

060653469

ABSTRACT:
A measurement system utilizes a sensor formed in a semiconductor on insulator structure that has an offset related to the time that power is applied. A controller applies power, obtains readings and removes power so as to minimize any effect of the offset.

REFERENCES:
patent: 3805062 (1974-04-01), Michon et al.
patent: 4539843 (1985-09-01), Wise

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