Measurement system for chromium content in chromized layers and

Details Measurement system for chromium content in chromized layers and Measurement system for chromium content in chromized layers and

1996-12-03

1998-01-13

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 44, G01N 23223

Patent

active

057086923

ABSTRACT:
A method and apparatus for measuring a target analyte diffused in a wall of a metal member provides a sample of the metal member which is cut to progressively reduce a wall thickness of the sample from zero at a first point on the sample to a selected depth at a second point on the sample. An x-ray analyzing system having an analyzing slot is moved past the sample between the first and second points. Data from the x-ray analyzing system during the translation of the sample is collected to analyze the analyte content.

REFERENCES:
patent: 4692935 (1987-09-01), Kumakura et al.
patent: 5081658 (1992-01-01), Imai et al.
patent: 5113421 (1992-05-01), Gignoux et al.

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