Measurement system and method

Details Measurement system and method Measurement system and method

2007-11-13

2007-11-13

Fulton, Christopher W (Department: 2859)

Geometrical instruments

Distance measuring

By flexible tape

C033S760000, C033S194000

Reexamination Certificate

active

11242267

ABSTRACT:
An apparatus and method are provided for accurately recording measurements of a window and producing accurate window treatments. A reference strip is provided having measurement indicia thereon, such as a checkerboard pattern of squares of predetermined sizes. The reference strip may be placed proximate a window and photographed. The size of the window may be accurately determined from the resulting photograph using the associated reference strip. The window may also be measured and the measurements stored as biographic data and associated with the photograph to form an accurate and verifiable window biography. The biography may be provided to another party, such as a treatment manufacturer, who verifies the measurements of the biographic data using photograph and produces a suitable window treatment according to the measurements.

REFERENCES:
patent: 2803062 (1957-08-01), Dutcher
patent: 5012590 (1991-05-01), Wagner et al.
patent: 5195249 (1993-03-01), Jackson
patent: 5528517 (1996-06-01), Loken
patent: 5881471 (1999-03-01), Kaluza
patent: 6108918 (2000-08-01), Ye
patent: 6145206 (2000-11-01), Piccirilo et al.
patent: 6349478 (2002-02-01), Ramsey, Jr. et al.
patent: 6865817 (2005-03-01), Militello et al.
patent: 6959499 (2005-11-01), Bini
patent: 2002/0064301 (2002-05-01), Sonnenberg et al.
patent: 19804198 (1998-08-01), None

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