Measurement probe with improved analog-to-digital conversion

Details Measurement probe with improved analog-to-digital conversion Measurement probe with improved analog-to-digital conversion

1994-04-22

1996-08-13

Williams, Howard L.

Coded data generation or conversion

Analog to or from digital conversion

Analog to digital conversion

341128, H03M 150

Patent

active

055460828

ABSTRACT:
A measuring probe measures a parameter with a sensor. The sensor provides a sensor output signal related to a measured value. An amplifier section receives the sensor output signal and provides an amplifier output signal. An integrator has an input and an integrator output related to an integration of the input. Switching circuitry receives the amplifier output signal and a reference signal and has an output connected to the input of the integrator. Controller circuitry coupled to the switching circuitry connects the amplifier output to the integrator input during a sampling time, and the reference signal to the integrator input during a conversion time. The conversion time is related to the sensor output signal and is measured to obtain a digital representation of the sensor output.

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