Measurement probe, in particular for an apparatus for...

Details Measurement probe, in particular for an apparatus for... Measurement probe, in particular for an apparatus for...

2005-12-20

2005-12-20

Fulton, Christopher W. (Department: 2859)

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

C033S834000

Reexamination Certificate

active

06977498

ABSTRACT:
The invention relates to a measurement probe, in particular for an apparatus for measurement of the thickness of thin layers, having a housing which has at least one printed circuit board and at least one sensor element which is associated with the printed circuit board, and having a contact cup which is arranged at the lower end of the housing, characterized in that a flexible strip, which has at least one connecting line, is provided on the at least one printed circuit board, and which is passed out of the housing.

REFERENCES:
patent: 2749505 (1956-06-01), McNary
patent: 4567436 (1986-01-01), Koch
patent: 5235756 (1993-08-01), Wickenhaver
patent: 6011391 (2000-01-01), Nix et al.
patent: 6538434 (2003-03-01), Steingroever et al.
patent: 6777930 (2004-08-01), Fischer

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