Measurement probe and using method for the same

Details Measurement probe and using method for the same Measurement probe and using method for the same

2006-06-27

2006-06-27

Fulton, Christopher W. (Department: 2859)

Geometrical instruments

Gauge

With support for gauged article

C033S561000

Reexamination Certificate

active

07065893

ABSTRACT:
A measuring probe for obtaining positional information on a measuring target face has: a movable member having a contact portion which is formed in its top and comes into contact with the measuring target face and a reflecting plane formed on its base end for reflecting a measuring light beam; a magnetic substance mounted on the movable member; a fixed member disposed in a fixed state; a bearing provided on the fixed member for supporting the movable member movably in axis line direction; and a magnetic force generating portion provided on the fixed member for generating force acting upon the magnetic substance to move the movable member in the axis line direction. The movable member is formed from a nonmagnetic material, and the bearing and the fixed member are formed from a magnetic material.

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patent: 2005/0283990 (2005-12-01), McMurtry et al.
patent: 4-98114 (1992-03-01), None
patent: 6-265340 (1994-09-01), None
patent: 2000-283747 (2000-10-01), None

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