Measurement probe

Details Measurement probe Measurement probe

2006-03-24

2009-10-20

Bennett, G. Bradley (Department: 2841)

Geometrical instruments

Gauge

Movable contact probe, per se

Reexamination Certificate

active

07603789

ABSTRACT:
A probe for position determining apparatus has a probe body (18) and a workpiece-contacting stylus (14). A strain sensitive structure connects the probe body and the stylus, and includes bendable members (32). The bendable members have an asymmetric cross-section, e.g. “T” shaped. A strain gauge (33) is mounted to the stem of the “T” to detect the bending caused when the stylus contacts a workpiece. This enables the strain sensitive structure to be both robust and sensitive to the bending.

REFERENCES:
patent: 4136458 (1979-01-01), Bell et al.
patent: 4553001 (1985-11-01), Kroetsch
patent: 5103572 (1992-04-01), Ricklefs
patent: 5111592 (1992-05-01), Aehnelt et al.
patent: 5228352 (1993-07-01), McMurtry et al.
patent: 5319858 (1994-06-01), Coy
patent: 5327657 (1994-07-01), Hajdukiewicz et al.
patent: 6678966 (2004-01-01), Koga et al.
patent: 7228642 (2007-06-01), Enderle et al.
patent: 7347000 (2008-03-01), Jordil et al.
patent: 2004/0118000 (2004-06-01), Roth et al.
patent: 2005/0278969 (2005-12-01), Jordil et al.
patent: 0 068 899 (1983-01-01), None
patent: WO 01/96809 (2001-12-01), None
patent: WO 02/068904 (2002-09-01), None
patent: WO 2004/051181 (2004-06-01), None

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