Optics: measuring and testing – For size of particles – By particle light scattering
Patent
1990-07-02
1991-08-06
Rosenberger, Richard A.
Optics: measuring and testing
For size of particles
By particle light scattering
356338, 356335, 356349, 356364, G01N 1502
Patent
active
050372025
ABSTRACT:
An apparatus is described for classifying particles and includes an optical system for transmitting to a focal plane which includes at least one particle, two substantially parallel optical beams, the beams being initially mutually coherent but of different polarizations. The beams are displaced and focused in the focal plane. A further optical system is positioned in the path which the beam takes after depating from the focal plane and combines the beams so that a particle-induced phase shift in one beam is manifest by a change in elliptical polarization of the combined beams. A first detector is responsive to the beam's intensity along a first polarization axis to produce a first output and a second detector is responsive to the beams intensity along a second polarization axis to produce a second output. The first and second outputs are added to provide an extinction signal and, in a separate device, are subtracted to provide to phase shift signal. The extinction signal and phase shift signal are both fed to a processor which classifies a particle in accordance therewith.
REFERENCES:
patent: 4284355 (1981-08-01), Hansen et al.
patent: 4358201 (1982-11-01), Makosch
patent: 4650330 (1987-03-01), Fujita
patent: 4850225 (1989-07-01), Chen et al.
Batchelder John S.
Taubenblatt Marc A.
International Business Machines - Corporation
Pham Hoa
Rosenberger Richard A.
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