Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate
2007-06-01
2008-10-28
Lefkowitz, Edward (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
C073S760000, C073S763000, C073S774000, C073S781000, C073S788000, C073S789000, C073S790000, C073S796000
Reexamination Certificate
active
07441465
ABSTRACT:
A method and system are provided for obtaining force-displacement responses for a specimen or sample of material. The sample is supported with a spanning portion spanning in an environment between at least three points not in a line, wherein the points are fixed relative to each other, and wherein the spanning portion is capable of displacement relative to the points. An oscillating mechanical excitation at at least one frequency and at at least one known amplitude is applied to the spanning portion. In addition, at least one other mechanical excitation is also applied to the spanning portion independently of the oscillating mechanical excitation.
REFERENCES:
patent: 3854328 (1974-12-01), Schmidt
patent: 3927558 (1975-12-01), Philippe et al.
patent: 3958450 (1976-05-01), Kleesattel
patent: 3994158 (1976-11-01), Weinhold
patent: 4084322 (1978-04-01), Albertazzi
patent: 4297884 (1981-11-01), Leveque et al.
patent: 4475403 (1984-10-01), Lentz
patent: 4478086 (1984-10-01), Gram
patent: 4848141 (1989-07-01), Oliver
patent: 4869111 (1989-09-01), Ohya et al.
patent: 4877957 (1989-10-01), Okada et al.
patent: 5195378 (1993-03-01), Ferguson
patent: 5224386 (1993-07-01), Curtis
patent: 5361640 (1994-11-01), Carroll et al.
patent: 5425276 (1995-06-01), Gram et al.
patent: 5693890 (1997-12-01), Holmes
patent: 5719339 (1998-02-01), Hartman et al.
patent: 6026677 (2000-02-01), Bonin
patent: 6247355 (2001-06-01), Suresh et al.
patent: 6679124 (2004-01-01), Oliver
patent: 6732591 (2004-05-01), Miles et al.
patent: 6844721 (2005-01-01), Oliver
patent: 2002/0017146 (2002-02-01), Oliver
patent: 2002/0162400 (2002-11-01), Xie et al.
patent: 2003/0016007 (2003-01-01), Oliver
patent: 2006/0016996 (2006-01-01), Kaneko et al.
patent: 2006/0186874 (2006-08-01), Mackin et al.
patent: 2680003 (1991-08-01), None
patent: WO 03/098193 (2003-05-01), None
Michael S. Baker, et al., Integrated Measurement-Modeling Approaches for Evaluating Residual Stress Using Micromachined Fixed-Fixed Beams, Journal of Microelectromechanical Systems, vol. 11, No. 6, Dec. 2002, pp. 743-753.
H.D.Espinosa, et al., Fracture strength of ultrananocrystalline diamond thin films-identification of Weibull parameters, Journal of Applied Physics, vol. 94,No. 9, Nov. 1, 2003, pp. 6076-6084.
H.D. Espinosa et al., A New Methodology to Investigate Fracture Toughness of Freestanding MEMS and Advanced Materials in Thin Film Form, Feb. 2005, Journal of Microelectromechanical Systems, vol. 14, No. 1, pp. 153-159.
Meyers, Marc A., “Introduction to Mechanical Testing” in Metals Handbook®: American Society for Metals, edited by Boyer and Gall, 34.1-34.4, Metals Park, OH: American Society for Metals, 1985.
Pethica, J.B. and W.C. Oliver, “Mechanical Properties of Nanometre Volumes of Material: Use of the Elastic Reponse of Small Area Indentations” Materials Research Society Symposium Proceedings 130, 13-23, 1989.
Oliver, W.C. and G.M. Pharr, “An improved technique for determining hardness and elastic modulus using load and displacement sensing identation experiments” Journal of Materials Research, vol. 7, No. 6, 1564-1583, 1992.
Report prepared by D. Read, “Piezo-Actuated Microtensile Test Apparatus” Materials Reliability Division of the National Institute of Standards and Technology, Boulder, CO, pp. 255-259, circa 1996.
Lucas, B.N., W.C. Oliver and J.E. Swindeman, “The Dynamics of Frequency-Specific, Depth-Sensing Indentation Testing” Reprinted from Materials Research Society, Symposium Proceedings: Fundamentals of Nanoindentation and Nanotribology, vol. 522, Eds. Baker, S.P., N.A. Burnham, W.W. Gerberich and N.R. Moody).
H.D. Espinosa, et al., Elasticity, Strength and Toughness of Three Novel MEMS/NEMS Materials-3C-SiC,UNCD,ta-C, Journal of Microelectromechanical Systems, 2005.
Nanomechanical testing of circular freestanding polymer films with sub-micron thickness, Kyle C. Maner et al, Nano-Innovation Center, MTS Instruments, Oak Ridge, TN 37830, USA Structural and Solid Mechanics Group, Department of Civil Engineering, University of Virgina, Charlottesville, VA 22904, USAcDepartment of Materials Science and Engineering, University of Virgina, Charlottesville, VA 22904, USA Recieved May 7, 2004; revised Jul. 15, 2004; accepted Jul. 23, 2004.
Indentation of freestanding circular elastomer films using spherical indenters. Acta Materialia, vol. 52, Issue 16, pp. 4877-4885 O. Scott, M. Begley, U. Komaragiri, T. Mackin.
An investigation into DMTA clamping problems, Leonard T.; Gooberman G.,Meausrement Science and Technology, vol. 3, No. 3, 1992, pp. 1992, pp. 275-282(8), Institute of Physics Publishing.
Official Search Report and Written Opinion of the European Patent Office in counterpart foriegn application No. PCT/us2007/012944 filed Jun. 1, 2007.
Nanomechanical testing of circular freestanding polymer films with sub-micron thickness, Kyle C. Maner et al, Nano-Innovation Center, MTS Instruments, Oak Ridge, TN 37830, USA Structural and Solid Mechanics Group, Department of Civil Engineering, University of Virgina, Charlottesville, VA 22904, USAcDepartment of Materials Science and Engineering, University of Virgina, Charlottesville, VA 22904, USA Recieved May 7, 2004; revised Jul. 15, 2004; accepted Jul. 23, 2004.
Indentation of freestanding circular elastomer films using spherical indenters. Acta Materialia, vol. 52, Issue 16, pp. 4877-4885 O. Scott, M. Begley, U. Komaragiri, T. Mackin.
An investigation into DMTA clamping problems, Leonard T.; Gooberman G.,Measurement Science and Technology, vol. 3, No. 3, 1992, pp. 1992, pp. 275-282(8), Institute of Physics Publishing.
Official Search Report and Written Opinion of the European Patent Office in counterpart foriegn application No. PCT/us2007/012944 filed Jun. 1, 2007.
Spherical indentation of freestanding circular thin films in the membrane regime Matthew R. Begley et al., Structural and Solid Mechanics Program, Department of Civil Engineering, University of Virgina, Charlottesville, Va 22904, USA, Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 68102, USA Received Jan. 14, 2004; Revised Mar. 2, 2004; accepted Mar. 3, 2004.
Herbert Erik G.
Oliver Warren C.
Agilent Technologie,s Inc.
Kirkland, III Freddie
Lefkowitz Edward
LandOfFree
Measurement of properties of thin specimens based on... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measurement of properties of thin specimens based on..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement of properties of thin specimens based on... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4000783