Measurement of polarization-resolved optical scattering...

Details Measurement of polarization-resolved optical scattering... Measurement of polarization-resolved optical scattering...

2005-09-06

2005-09-06

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By polarized light examination

C398S065000, C398S152000, C359S483010, C702S106000

Reexamination Certificate

active

06940594

ABSTRACT:
Method and apparatus for determining scattering parameters of a scattering matrix of an optical device. A method according to the present invention comprises applying an optical stimulus to a plurality of ports of the optical device, measuring optical fields emerging from the plurality of ports in amplitude and phase, and calculating the scattering parameters using the measured optical fields. The applying step includes applying the optical stimulus to the plurality of ports simultaneously. The method ensures a consistent phase reference for measurement of all of the scattering parameters so that all measurable characteristics of the device can be calculated directly from the scattering parameters.

REFERENCES:
patent: 5293210 (1994-03-01), Berndt
patent: 6301037 (2001-10-01), Fischer et al.
Walker, N.C.; Carroll, J.E., Simultaneous Phase and Amplitude Measurements on Optical Signals Using a Multiport Juction, Electronics Letters, Nov. 8, 1984, vol. 20, No. 23, p. 981-983.

Affiliated with

Also associated with

Rating

Measurement of polarization-resolved optical scattering... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measurement of polarization-resolved optical scattering..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement of polarization-resolved optical scattering... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3385850