Measurement of phase nonlinearity of non-linear devices

Details Measurement of phase nonlinearity of non-linear devices Measurement of phase nonlinearity of non-linear devices

2007-09-18

2007-09-18

Barlow, John (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S072000, C702S079000, C324S076830

Reexamination Certificate

active

11058520

ABSTRACT:
A method for determining the phase characteristics of a nonlinear analog device includes application of a test signal, which may be linear-FM, to the nonlinear device. The converted signal is digitized and mathematically converted to baseband in ideal fashion. A digitized version of the original test signal and the downconverted signal are phase compared to determine the phase error.

REFERENCES:
patent: 4968968 (1990-11-01), Taylor
patent: 5781539 (1998-07-01), Tanaka

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