Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2011-07-26
2011-07-26
Chowdhury, Tari Fur (Department: 2886)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C356S516000
Reexamination Certificate
active
07986414
ABSTRACT:
A frequency scanning interferometer is arranged for simultaneously measuring multiple surfaces of a test object through a wide range of expected offsets. Knowledge of the expected locations of the test surfaces is compared with a sequence of ambiguity intervals based on a synthetic measurement wavelength to center the test surfaces within the ambiguity intervals.
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Lee Christopher Alan
Tronolone Mark Joseph
Chowdhury Tari Fur
Cook Jonathon
Corning Incorporated
Schaeberle Timothy M.
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