Measurement of inductance using a digital storage...

Details Measurement of inductance using a digital storage... Measurement of inductance using a digital storage...

2005-04-05

2005-04-05

Assouad, Patrick (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S064000, C324S600000, C324S654000

Reexamination Certificate

active

06876936

ABSTRACT:
A method and apparatus for measuring inductance. The method and apparatus include processing current and voltage waveform data associated with an inductive device to determine edge and slope parameters for each of a plurality of current waveform data cycles. Furthermore, proportional magnetic flux and proportional magnetic current is determined from the acquired current waveform data and the voltage waveform data proximate determined edge regions of the waveform data. An inductance value of the inductive device may then be calculated from the proportional magnetic flux and proportional magnetic current.

REFERENCES:
patent: 3904859 (1975-09-01), Poncelet
patent: 20020180458 (2002-12-01), Ho et al.

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