Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Patent
1984-03-27
1986-10-21
Tokar, Michael J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
324 96, 350356, G01R 2316
Patent
active
046188193
ABSTRACT:
Electrical signals are measured (analyzed and displayed) with subpicosecond resolution by electro-optic sampling of the signal in an electro-optic crystal, the index of which changes in response to the electric field produced by the signal, in accordance with the Pockels effect. The crystal is disposed adjacent to and in the fringe field of a line on a substrate, which may be part of an integrated circuit, for measuring signals propagating along the line during the operation of the circuit. A beam of short optical (laser) sampling pulses in the picosecond range is focused preferably close to the surface of the crystal and perpendicular to the optical axis of the crystal. The optical pulses transmitted through the crystal are processed to provide a display affording a measurement of the electrical signal.
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patent: 4253060 (1981-02-01), Chen
patent: 4446425 (1984-05-01), Valdmanis
Valdmanis & Mourou, "Subpicosecond Electrical Sampling and Applications, Chapter 8, Picosecond Optoelectronic Devices, 1984, pp. 249-270.
Valdmanis et al, "Picosecond Electro-optic Sampling System", Appl. Phys. Lett. 41(3) Aug. 1, 1982, pp. 211, 212.
Valdmanis, "Subpicosecond Electrical Sampling", IEEE, Journal of Quant. Elec., QE19, No. 4, Apr. 83, pp. 664-667.
Reprinted from Electronic Letters, 6/20/85, vol. 21, No. 13, pp. 568, 569, "Two Dimensional E-Field Mapping with Subpicosecond Temporal Resolution".
Meyer and Mourou, "Two Dimensional E-Field Mapping with Subpicosecond Resolution", U of Rochester, 250 E. River Road, Rochester, NY, 14623, pp. 46-49.
Mourou Gerard
Valdmanis Janis A.
Lukacher Martin
The University of Rochester
Tokar Michael J.
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