Measurement of degree of offset of attachment position of drafti

Geometrical instruments – Scriber

Patent

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33 1B, 33 40, G01D 1516

Patent

active

045744831

ABSTRACT:
The offset of the attachment position of each drafting pen in a coordinate plotter can be measured by drawing, with a standard drafting pen different from the first-mentioned plural drafting pen, main scale line segments dividing a predetermined distance from a reference line equally into n divisions; drawing, from the position of the reference line and with the first-mentioned drafting pen, auxiliary scale line segments dividing the predetermined distance equally into n+1 divisions while causing the auxiliary scale line segments to overlap partly with the main scale line segments; and determining a position, where either one of the main scale line segments is coincided with either one of the auxiliary scale line segments. The method of this invention thus allows to adjust the offsets of drafting pens readily and accurately in a coordinate plotter.

REFERENCES:
patent: 4157552 (1979-06-01), Nakajima
patent: 4475288 (1984-10-01), Pellegrom

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