Measurement of deformation

Details Measurement of deformation Measurement of deformation

1982-03-09

1984-10-02

McGraw, Vincent P.

Optics: measuring and testing

Material strain analysis

73800, 356 355, 356358, 356 33, G01B 1116, G01L 124

Patent

active

044744668

ABSTRACT:
In a strain sensing system in which a strained grating is illuminated with a pair of beams chosen from three possible beams to sense strain in two dimensions, an arrangement is disclosed of two beam splitters, as least one plane mirror, and three tilted mirrors, all fixed to a support plate and which can supply the three required illuminating beams.

REFERENCES:
patent: 4170401 (1979-10-01), Yoder
Z. Fuzechi, Improved Interference-Hologram Method for Measurement of Displacement, Soviet Physics Tech: Physics, Col. 24, No. 2, Feb. 1979, pp. 230-232.
Real-Time Observation of-in Plane Displacements of Opaque Surfaces, pp. 119-123 of Optics and Laser Technology, Jun. 1973.

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