Measurement of complex surface shapes using a spherical...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07030996

ABSTRACT:
Conical surfaces (and other complex surface shapes) can be interferometrically characterized using a locally spherical measurement wavefront (e.g., spherical and aspherical wavefronts). In particular, complex surface shapes are measured relative to a measurement point datum. This is achieved by varying the radius of curvature of a virtual surface corresponding to a theoretical test surface that would reflect a measurement wavefront to produce a constant optical path length difference (e.g., zero OPD) between the measurement and reference wavefronts.

REFERENCES:
patent: 4340306 (1982-07-01), Balasubramanian
patent: 4387994 (1983-06-01), Balasubramanian
patent: 4553238 (1985-11-01), Shaw et al.
patent: 4713822 (1987-12-01), Lee
patent: 4725144 (1988-02-01), Nelson et al.
patent: 4743117 (1988-05-01), Kitabayashi et al.
patent: 4872755 (1989-10-01), Küchel
patent: 4898470 (1990-02-01), Cleaveland
patent: 5048026 (1991-09-01), Shaw et al.
patent: 5086433 (1992-02-01), Pocholle et al.
patent: 5172388 (1992-12-01), Long et al.
patent: 5271031 (1993-12-01), Baer
patent: 5285467 (1994-02-01), Scheps
patent: 5335236 (1994-08-01), Toeppen
patent: 5393214 (1995-02-01), Irie et al.
patent: 5398113 (1995-03-01), de Groot
patent: 5485275 (1996-01-01), Ohtsuka
patent: 5608166 (1997-03-01), Monchalin et al.
patent: 5784164 (1998-07-01), Deck et al.
patent: 5790303 (1998-08-01), Weston et al.
patent: 5872804 (1999-02-01), Kan et al.
patent: 5930282 (1999-07-01), Unternahrer et al.
patent: 5991035 (1999-11-01), Bruning
patent: 5991315 (1999-11-01), Injeyan et al.
patent: 6094447 (2000-07-01), Drake, Jr.
patent: 6134258 (2000-10-01), Tulloch et al.
patent: 6154279 (2000-11-01), Thayer
patent: 6157663 (2000-12-01), Wu et al.
patent: 6167181 (2000-12-01), Fukaishi
patent: 6195168 (2001-02-01), De Lega et al.
patent: 6285704 (2001-09-01), Kullander-Sjoberg et al.
patent: 2001/0028462 (2001-10-01), Ichihara et al.
patent: 2003/0011783 (2003-01-01), Suzuki et al.
patent: 2003/0043385 (2003-03-01), Kuchel
patent: 2005/0134863 (2005-06-01), De Lega et al.
patent: WO 01/27558 (2001-04-01), None
patent: WO 01/75395 (2001-10-01), None
patent: WO 02/14845 (2002-02-01), None
C. Honninger, et al.;Diode-Pumped Thin-Disk Yb: YAG Regenerative Amplifier, Applied Physics B, pp. 423-426.
Steven Jackel, et al.;High-Energy Nd:Dr:GSGG Lasers Based on Phase and Polarization Conjugated Multiple-Pass Amplifiers; Optical Engineering, vol. 36, No. 7, Jul. 1997, pp. 2031-2036.
K. F. Wall, et al.;A Ti:Al2O3Master-Oscillator/Power-Amplifier System; IEEE Journal of Quantum Electronics, Jun. 1993, No. 6, pp. 1505-1514.
Boppart et al., “Forward-imaging instruments for optical coherence tomography”,Optics Letters, vol. 22, No. 21, pp. 1618-1620 (Nov. 1, 1997).
Blümel et al., “Absolute interferometric calibration of toric and conical surfaces”,SPIE, vol. 3134, pp. 370-378 (Jul. 1997).
Brinkman et al., “Testing of rod objects by grazing-indience interferometry experiment”,Applied Optics, vol. 38, No. 1, pp. 121-125 (Jan. 1, 1999).
Chakmakjian et al., “Simultaneous focus and coherence scanning in interference microscopy”,Technical Digest, International Workshop on Interferometry, 171 (Riken, Japan, 1996).
Dresel et al., “Three-dimensional sensing of rough surfaces by coherence radar”,Applied Optics, vol. 31, No. 7, pp. 919-925 (Mar. 1, 1992).
Li et al., “Imaging needle for optical coherence tomography”,Optics Letters, vol. 25, No. 20, pp. 1520-1522 (Oct. 15, 2000).
Lindner et al., “White-light interferometry via an endoscope”,SPIE, vol. 4777, pp. 90-101 (Jul. 2002).
Matthys et al., “Panoramic Holointerferometry”,Experimental Mechanics, vol. 35, No. 1, pp. 83-88 (Mar. 1995).
Schwider, “White-light Fizeau interferometer”,Applied Optics, vol. 36, No. 7, pp. 1433-1437 (Mar. 1997).
Zhou et al., “Surface profile measurements using a white light Linnik interferometer”,Annual Report Lehrstuhl für Optik, Univ. Elrlangen-Nürnbergpp. 69 (1996).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Measurement of complex surface shapes using a spherical... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measurement of complex surface shapes using a spherical..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement of complex surface shapes using a spherical... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3580379

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.