Measurement method for the determination of low levels of optica

Details Measurement method for the determination of low levels of optica Measurement method for the determination of low levels of optica

1991-02-21

1993-02-09

Rosenberger, Richard A.

Optics: measuring and testing

For light transmission or absorption

By comparison

356432, 356437, G01N 2100

Patent

active

051856450

ABSTRACT:
A measurement method is presented for the determination of low levels of optical absorption in any material, with at least a quasi-simultaneous detection of the transmission intensities of a measurement light beam and a reference light beam, the wavelengths of which are different, such that, essentially, the measurement light is absorbed by the material to be tested, and with a joint analog acquisition of the detected measurement and reference signals, taking into consideration the natural difference in intensities between the measurement light beam and the reference light beam.

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Yoshinori Nakano & Nobuyori Tsuzuki; Active layer thickness measurement system for double heterostructure laser wafers; Jan. 1989; Optical Engineering vol. 28 No. 1; 042-045.
Transmissions-Photometer brochure from Pier-Electronic.

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