Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Patent
1997-02-27
1999-06-01
Shah, Kamini
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
356346, 359244, G01J 1100
Patent
active
059096594
ABSTRACT:
The present invention is directed toward realizing a measurement method that enables finding the intensity waveform of optical short-pulse as well as the change in chirp frequency over time at a high resolution. Such a method involves irradiating an optical short-pulse that is to be measured at a delay time .tau. upon a first photoconductor that enters a conductive state when irradiated by light and upon a second photoconductor that enters a conductive state only when irradiated by light while the first photoconductor is in a conductive state. In this way, the autocorrelation waveform of optical short-pulse that is to be measured is found; the result F(.omega.) of a Fourier transform of the autocorrelation waveform of optical short-pulse to be measured is found; and this result is divided by the result of a Fourier transform of the cross-correlated waveform h.sub.12 (.tau.) of the impulse response waveform h.sub.1 (t) of the first photoconductor and the impulse response waveform h.sub.2 (t) of the second photoconductor to find the intensity power spectrum .vertline.I(.omega.).vertline..sup.2 from which the response characteristics of the photoconductors are eliminated, and finding short-pulse waveform from above-described .vertline.I(.omega.).vertline..sup.2 and field power spectrum .vertline.E(.omega.).vertline..sup.2.
REFERENCES:
patent: 5033853 (1991-07-01), Frangineas, Jr.
patent: 5805327 (1998-09-01), Usami et al.
Advantest Corporation
Shah Kamini
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