Optics: measuring and testing – Lens or reflective image former testing
Reexamination Certificate
2006-08-24
2010-11-02
Chowdury, Tarifur (Department: 2886)
Optics: measuring and testing
Lens or reflective image former testing
Reexamination Certificate
active
07826044
ABSTRACT:
A measurement method for measuring an optical characteristic of a target optical system includes the steps of introducing a light from each of plural patterns that reduce diffracted lights other than a predetermined order, to a different position on a pupil plane of the target optical system, the introducing step including the step of scanning the light in a radial direction in the pupil plane of the target optical system, detecting a imaging position of the light introduced by the introducing step, on an image plane of the target optical system, and obtaining the optical characteristic of the target optical system based on a detection result of the detecting step.
REFERENCES:
patent: 5828455 (1998-10-01), Smith et al.
patent: 5978085 (1999-11-01), Smith et al.
patent: 7598006 (2009-10-01), Smith et al.
patent: 2002/0145717 (2002-10-01), Baselmans et al.
patent: 2003/0091913 (2003-05-01), Shiode
patent: 2004/0156041 (2004-08-01), Shiode
patent: 2004-146454 (2004-05-01), None
Canon Kabushiki Kaisha
Chowdury Tarifur
LaPage Michael
Rossi Kimms & McDowell LLP
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