Measurement interface optimized for both differential and...

Details Measurement interface optimized for both differential and... Measurement interface optimized for both differential and...

2005-08-16

2005-08-16

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S107000, C341S118000, C327S361000

Reexamination Certificate

active

06931331

ABSTRACT:
Offset adjustments for both differential and single-ended measurements are accomplished in the same probe or system. Different variable offsets are provided for the positive and negative inputs of a differential amplifier, and a variable offset adjustment is provided to remove differential amplifier output offset. Common mode and reduced dynamic range problems for both differential and single-ended measurements are eliminated. All or desired portions of required functions may be implemented using discrete or DSP approaches.

REFERENCES:
patent: 3710139 (1973-01-01), Werner
patent: 3737640 (1973-06-01), Pao et al.
patent: 3868679 (1975-02-01), Arneson
patent: 3967901 (1976-07-01), Rodriguez
patent: 3978402 (1976-08-01), Ryder
patent: 4182993 (1980-01-01), Tyler
patent: 5384739 (1995-01-01), Keeth

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