Measurement instrument and measurement method

Details Measurement instrument and measurement method Measurement instrument and measurement method

2007-12-04

2007-12-04

Bayard, Emmanuel (Department: 2611)

Pulse or digital communications

Testing

Phase error or phase jitter

C375S371000

Reexamination Certificate

active

10925870

ABSTRACT:
A measuring apparatus for measuring reliability against jitter of an electronic device, including: a jitter tolerance estimator operable to estimate a jitter tolerance of the electronic device based on an output signal output from the electronic device according to an input signal input through a transmission line of which the transmission length is shorter than a predetermined length so that it does not generate a deterministic jitter; a jitter tolerance degradation quantity estimator operable to estimate a quantity of degradation of the jitter tolerance which deteriorates by the deterministic jitter caused in the input signal by transmission through the long transmission line when the input signal is input into the electronic device through the transmission line, of which the transmission length is longer than a predetermined length so that it may cause the deterministic jitter; a system jitter tolerance estimator operable to estimate a jitter tolerance of the electronic device and a jitter tolerance of a system including the long transmission line and the electronic device based on quantity of degradation of the jitter tolerance, is provided.

REFERENCES:
patent: 7012982 (2006-03-01), Basch et al.
patent: 08-050156 (1996-02-01), None
patent: 08-248078 (1996-09-01), None
patent: 11-083924 (1999-03-01), None
U. S. Office Action issued in corresponding U.S. Appl. No. 10/776,926 dated May 14, 2007 (24 pages).
Patent Abstract s of Japan, publication No. 11-083924, date of publication Mar. 26, 1999; 1 page.
Patent Abstracts of Japan, publication No. 08-050156, date of publication Feb. 20, 1996, 1 page.
Japanese International Search Report, dated May 6, 2003.
PCT Patent Abstract, publication No. 03/073115 A1, publication date Sep. 4, 2003, 1 page.
Patent Abstracts of Japan, publication No. 08-248078; publication date Sep. 27, 1996, 1 page.

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