Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2005-03-29
2005-03-29
Larkin, Daniel S. (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C250S306000, C250S307000
Reexamination Certificate
active
06871527
ABSTRACT:
An improvement for atomic force microscopes, more generally for light beam detecting systems, but also in part applicable to scanning probe microscopes, providing significant novel features and advantages. Particular features include using different objective lens regions for incident and reflected light, a flexure that allows three dimensional motion of the optics block, forming the housing and optics block of a composite material or ceramic, arranging the components so that the beam never hits a flat surface at normal incidence, and providing a resonant frequency of cantilever vibration greater than 850 HZ between the cantilever and sample and the cantilever and focusing lens.
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Mario B. Viani, et al., “Small cantilevers for force spectroscopy of single molecules;” Journal of Applied Physics, vol. 86, No. 4, pp. 2258-2262.
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Drake Barney
Hale David
Hansma Paul K.
Kindt Johannes H.
Thompson James
Fulbright & Jaworski
Larkin Daniel S.
The Regents of the University of California
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