Measurement head

Geometrical instruments – Area integrators – Electrical

Patent

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Details

33DIG2, 33DIG3, 33DIG13, G01B 702

Patent

active

041775686

ABSTRACT:
The invention contemplates an improved work-contacting probe for use in a measuring machine wherein the relationship between contacted locations on a workpiece are reduced to coordinate digital data. The various described probe embodiments feature means whereby positional errors due to probe flexure upon work contact are substantially reduced, as compared to pre-existing structures.

REFERENCES:
patent: 3028675 (1962-04-01), Mahlmeister et al.
patent: 3883956 (1975-05-01), Zeewy et al.
patent: 3945124 (1976-03-01), Jacoby et al.

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