Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-03-04
2008-03-04
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C701S102000
Reexamination Certificate
active
07340358
ABSTRACT:
A measurement equipment has a polygonal line processing section and a computational processing section. The polygonal line processing section produces a polygonal line pattern signal based on a predetermined polygonal line pattern having a polygonal line value that varies according to a polygonal line time and a timer processing for the polygonal line time. The computational processing section executes a computational processing with using an external input signal and the polygonal line pattern signal.
REFERENCES:
patent: 5039937 (1991-08-01), Mandt et al.
patent: 5935187 (1999-08-01), Trsar et al.
patent: 7010444 (2006-03-01), Nishikobara et al.
patent: 2003/0220753 (2003-11-01), Pickerd et al.
patent: 2004-245583 (2004-09-01), None
Barlow John
Sughrue & Mion, PLLC
Taylor Victor J.
Yokogawa Electric Corporation
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