Measurement device for measuring a magnetic field

Electricity: measuring and testing – Magnetic – Displacement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S228000, C324S244000

Reexamination Certificate

active

08067934

ABSTRACT:
A measuring device to measure a magnetic field having at least one measuring coil and at least one sensor to measure low-frequency magnetic fields, which measuring coil and which sensor have their planes of extension each positioned or positionable transverse to the flux direction of the magnetic field. The measuring coil and the sensor are connected to a signal processing device with which, depending on a first measurement signal provided by the measuring coil and a second measurement signal provided by the sensor, an output signal that essentially corresponds to the magnetic field can be generated. The measuring coil, the sensor, and the signal processing device are monolithically integrated into a semiconductor chip. The measuring coil may also be formed by means of traces of a printed circuit board on which the semiconductor chip that has the sensor and the signal processing device is located.

REFERENCES:
patent: 6366076 (2002-04-01), Karrer et al.
patent: 6566855 (2003-05-01), Nguyen et al.
patent: 6624624 (2003-09-01), Karrer et al.
patent: 7164263 (2007-01-01), Yakymyshyn et al.
patent: 2008/0204010 (2008-08-01), Crozier et al.
patent: 69802203 (2002-06-01), None
patent: 1314602 (2004-10-01), None
patent: 1012609 (2001-10-01), None
patent: 1183543 (2003-04-01), None
patent: 10314993 (2003-05-01), None
patent: 1746430 (2007-01-01), None
patent: 434598 (2001-05-01), None
patent: 448528 (2001-08-01), None
patent: 9848287 (1998-10-01), None
patent: 2006034551 (2006-04-01), None
Dalessandro, L., N. Karrer, and J. W. Kolar. “A Novel Isolated Current Sensor for High-Performance Power Electronics Applications.” APEC 2006. Twenty-First Annual IEEE Applied Power Electronics Conference and Exposition. Mar. 19, 2006-Mar. 23, 2006. pp. 559-566.
Karrer, N. “Measurements1with HAL805.” Mar. 15, 2000. pp. 1-8. Version 1.00.
Karrer, Nicolas and Hofer-Noser, Patrick. “A New Current Measuring Principle for Power Electronic Applications.” Proceedings of ISPSD '99, pp. 279-282, May 1999. Electrical Engineering and Design Lab (EEK). Zurich, Switzerland.
Karrer, Nicolas, Hofer-Noser, Patrick, and Henrad, Daniel “A New Current Probe with a Wide Bandwidth.” Electrical Engineering and Design Lab (EEK). Swiss Federal Institute of Technology. Zurich, Switzerland.
Xiao, Chucheng, Zhao, Lingyin, Asada, Tadashi, Odendaal, W. G., and Van Wyk, J. D. “An Overview of Integratable Current Sensor Technologies.” Conference Record of the 2003 IEEE Industry Applications Conference. 38th IAS Annual Meeting. Salt Lake City, UT, Oct. 12-16, 2003. vol. 3 of 3. Conference 38, Oct. 12, 2003. pp. 1251-1258.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Measurement device for measuring a magnetic field does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measurement device for measuring a magnetic field, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement device for measuring a magnetic field will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4289611

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.