Measurement deferral and aggregation for extensible test...

Details Measurement deferral and aggregation for extensible test... Measurement deferral and aggregation for extensible test...

2008-05-13

2008-05-13

Tieu, Binh K. (Department: 2614)

Telephonic communications

Diagnostic testing, malfunction indication, or electrical...

C370S241000, C370S252000, C709S224000, C709S230000

Reexamination Certificate

active

07372946

ABSTRACT:
A system having a diagnostic measurement system (DMS) and method include a multi-protocol application test identifying components corresponding to protocols mixed within the multi-protocol application test, executing the protocols to collect measurements of the components, combining the measurements of the components to generate measurements corresponding to the multi-protocol application test, and outputting the measurements of the multi-protocol application test to the DMS, wherein the multi-protocol application test defers outputting the measurements of the components to the DMS as the measurements are collected from each protocol.

REFERENCES:
patent: 7299277 (2007-11-01), Moran et al.
patent: 2002/0124108 (2002-09-01), Terrell et al.
patent: 2002/0161907 (2002-10-01), Moon
patent: 2003/0120822 (2003-06-01), Langrind et al.
patent: 2004/0001579 (2004-01-01), Feinberg et al.

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