Data processing: measuring – calibrating – or testing – Measurement system
Reexamination Certificate
2005-05-10
2005-05-10
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
C702S182000, C702S183000, C702S186000, C702S188000
Reexamination Certificate
active
06892158
ABSTRACT:
A measurement data collection apparatus includes at least a collection/analysis processing device having a measuring instrument interface for converting measurement data input from a measuring instrument into data of a form corresponding to measurement contents, and a measurement data collection interface for converting the data of the form corresponding to the measurement contents into measurement data of a predetermined form. The apparatus can process the results obtained from the measurement as electronic data irrespective of the measurement contents or a kind of the measuring instrument and can perform form printing or data processing such as arithmetic operations.
REFERENCES:
patent: 4665621 (1987-05-01), Ackerman et al.
patent: 5120943 (1992-06-01), Benz
patent: 6615133 (2003-09-01), Boies et al.
patent: 20030004691 (2003-01-01), Michiwaki et al.
Hirai Atsushi
Ichikawa Yuya
Kojima Koichi
Torii Hideo
Yoshida Yoshifumi
Bui Bryan
Seiko Epson Corporation
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