Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-03-11
2008-03-11
Nguyen, Vincent Q (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S637000
Reexamination Certificate
active
07342401
ABSTRACT:
A bias tee for connecting a measurement device to a DUT, where the measurement device has a guard output, includes a DC port; a HF port; and a measurement port. The HF input port is guarded with the guard output during operation of the bias tee.
REFERENCES:
patent: 6396298 (2002-05-01), Young et al.
patent: 6657522 (2003-12-01), Buber et al.
patent: 2006/0022771 (2006-02-01), Daxiong
Efficient Microwave Bias and Testing Using the HP 4142B Modular DC Source/Monitor. Hewlett Packard. Application Note 1205 (No Month/Date/Year availble).
Keithley Instruments Inc.
Nguyen Vincent Q
Pearne & Gordon LLP
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