Measurement arrangement for determining the characteristic...

Details Measurement arrangement for determining the characteristic... Measurement arrangement for determining the characteristic...

2011-08-02

2011-08-02

Natalini, Jeff (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S637000

Reexamination Certificate

active

07990158

ABSTRACT:
The present invention relates to a measurement arrangement for determining the characteristic line parameters by measuring the S-parameters as a function of the frequency of transmission lines. A voltage mesh and a ground mesh in a metal layer are connected symmetrically to a reference ground (RG) in the layer at all ends.

REFERENCES:
patent: 6480989 (2002-11-01), Chan et al.
patent: 6586828 (2003-07-01), Buffet et al.
patent: 7088110 (2006-08-01), Bois et al.
patent: 7340703 (2008-03-01), Hegazy et al.
patent: 2004/0237013 (2004-11-01), Larson et al.
patent: 2006/0022678 (2006-02-01), Hegazy et al.
Thomas-Michael Winkel et al. “An Accurate Determination of the Characteristic Impedance of Lossy Lines on Chips Based on High Frequency S-Parameter Measurements”, IEEE Multi-Chip Module Conference MCMC'96, pp. 190-195, Feb. 1996.
Thomas-Michael Winkel “Untersuchung der Kipplung zwischen Leitungen auf Silizium-Substraten unterschiedlicher Leitfahigkeit unter verwendung breibandiger Messungen”, Ph.D Thesis, University of Hannover, Nov. 1997, pp. 50-77.
Zinke/Brunswig “Lehrbuch der Hochfrequenztechnik”, Springer-Verlag, 1989, pp. 170-189.

Affiliated with

Also associated with

Rating

Measurement arrangement for determining the characteristic... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measurement arrangement for determining the characteristic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement arrangement for determining the characteristic... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2669876