Measurement arrangement

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S637000, C342S022000

Reexamination Certificate

active

06531881

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
The invention relates to a measurement arrangement typically for road thickness measurement.
2. Discussion of the Background
Civil engineering materials are often non-homogenous comprising a matrix of two or more products with different particle size and physical properties.
FIG. 1
shows part of a typical road structure with a wearing surface layer and a sub base layer of courser material.
Typical of these materials are concrete asphalt and bituminous macadam. When these materials are used as surfacing or cladding for structures such as roads and buildings, it is sometimes necessary to measure the thickness of the surfacing to establish the engineering strength of the structure.
The usual method of measuring the thickness of these materials is to take samples of the material using a coring tool. This can give a very accurate measure if properly used but it suffers from a number of disadvantages. The integrity of the original surface is destroyed by taking a core sample and even if properly repaired it may lead to early deterioration of the surface. Coring of small area structures such as road reinstatements is impractical as the area of the core may be a substantial fraction of the area of the reinstatement. A core sample provides only a spot measurement which may not be representative of the general condition of the rest of the structure.
Non intrusive measurement techniques have proved difficult due to the non-homogenous matrix of materials employed in such structures.
SUMMARY OF THE INVENTION
According to the invention there is provided a device for measuring the thickness of a non-homogenous medium and comprising means for transmitting pulses of electromagnetic energy through the material; first means for receiving a first reflected energy signal; second means spaced from the first means for receiving a second reflected energy signal; and, means for calculating material thickness using information derived from both the first and second reflected signals.
According to a further aspect of the invention there is provided a pulse radar method applicable to the calculation of the thickness of a non-homogenous meduim, comprising passing into the medium from a first location at the outer surface, a pulse of electromagnetic energy and receiving at second and third locations at the surface a reflected pulse and calculating the material thickness using information derived from both received and reflected pulses.


REFERENCES:
patent: 3634753 (1972-01-01), Unterberger
patent: 4745803 (1988-05-01), Haavasoja
patent: 5384715 (1995-01-01), Lytton
patent: 5497100 (1996-03-01), Reiser et al.
patent: 5835053 (1998-11-01), Davis

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Measurement arrangement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measurement arrangement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement arrangement will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3081935

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.