Oscillators – With frequency calibration or testing
Reexamination Certificate
2008-06-24
2010-06-29
Kinkead, Arnold (Department: 2817)
Oscillators
With frequency calibration or testing
C331S057000, C324S073100, C324S763010, C324S765010, C324S750010, C714S724000, C714S742000
Reexamination Certificate
active
07746183
ABSTRACT:
Disclosed herein is a measurement apparatus for improving performances of standard cells in a standard cell library when verifying performance of the standard cell library through a ring oscillator among various test element groups (TEGs). A built-in circuit is used to measure and verify performance of the standard cell library through a TEG. Therefore, it is possible to effectively improve performances of the standard cells in the standard cell library. Particularly, it is possible to not only remove human errors or internal errors of equipment, but also perform the measurement more readily, rapidly and accurately. Further, it is possible to curtail the use of high-performance equipment or manpower and time required in a measurement process.
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patent: 2007/0054649 (2007-03-01), Hattori
Cho Kyeong Soon
Kim Seong-Heon
Shin Woo Chol
Dongbu Hi-Tek Co., Ltd.
Kinkead Arnold
Sherr & Vaughn, PLLC
Tan Richard
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