Measurement apparatus for FET characteristics

Details Measurement apparatus for FET characteristics Measurement apparatus for FET characteristics

2008-07-22

2008-07-22

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S073100

Reexamination Certificate

active

07403031

ABSTRACT:
A measurement apparatus for FET characteristics comprises a divider connected to a pulse generator for dividing pulses from the pulse generator into first and second pulses; a first SMU; a first switch for selecting pulses from the divider or voltage from the first SMU; a terminal resistor for applying signals from the first switch and supplying the signals to the first terminal of the device under test; a second and a third SMU; a bias-T connected to the third SMU; a second switch for selecting to connect the second terminal of the device under test to the second SMU or to connect the second terminal to signals of the bias-T obtained by multiplexing the voltage from the third SMU; and voltage measurement unit connected to the divider and the bias-T.

REFERENCES:
patent: 5905384 (1999-05-01), Inoue et al.
patent: 6998869 (2006-02-01), Tanida et al.
patent: 2006/0145708 (2006-07-01), Saito
patent: 2006/0273807 (2006-12-01), Okawa
patent: 2007/0013407 (2007-01-01), Okawa
Jenkins, K.A. et al. “Measurement of I-V Curves of Silicon-on-Insulator (SOI) MOSFET's Without Self-Heating”. IEEE Electron Device Letters, vol. 16, No. 4, Apr. 1995.
International Conference on Microelectronic Test Structures Tutorial Short Course. Mar. 6, 2006.

Affiliated with

Also associated with

Rating

Measurement apparatus for FET characteristics does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measurement apparatus for FET characteristics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement apparatus for FET characteristics will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2767036