Thermal measuring and testing – Emissivity determination
Patent
1985-12-03
1987-02-24
Yasich, Daniel M.
Thermal measuring and testing
Emissivity determination
250341, 374122, G01J 500, G01N 2500
Patent
active
046453580
ABSTRACT:
The invention embodies a system and procedure for independently determining the surface emissivity of a mesh membrane material 12. The system is a closed one with respect to unwanted or uncorrected radiation outside the system and is composed of a radiometer 11 connected to a horn antenna 13, a test section 15 sealed to the horn antenna 13 and a cryogenically cooled matched load 17 exposed to the interior of the system. The material 12 is enclosed in a convection test chamber 14 within test section 15, heated within test chamber 14 and allowed to radiate within the system such that a component of the radiation energy of material 12 is measured by the radiometer 11 in terms of brightness temperature. The matched load 17 serves as the stabilizing source of uncorrelated radiation within the system by radiating within the system at a constant cryogenic temperature. The actual physical temperature of the material 12 is also measured during the heating process. The difference in brightness temperature over a selected period of time when divided by the physical temperature over the same period of time is the emissivity of the material 12 according to a derivation of the Raleigh-Jeans approximation for an ideal system free from all uncorrelated radiation.
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Helfrich George F.
Manning John R.
Marchant Robert D.
The United States of America as represented by the Administrator
Yasich Daniel M.
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