Measurement apparatus and method for the adjustment of test/meas

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Details

36455101, 36470912, 36470915, 324121R, 356 731, 345145, G01R 1300

Patent

active

058019537

ABSTRACT:
An instrument is described for the measurement of optical and/or electrical signals, such as an optical time domain reflectometer (OTDR) or an electrical time domain reflectometer (TDR). The instrument includes a display to depict a waveform representative of measured signals, and can be operated by a few buttons, namely a start/stop button, a cursor-key and a select/confirmation-key. After adjustment of display parameters, almost the entire display is available for display of measured signals and data.

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patent: 5654816 (1997-08-01), Fishman
European Search Report, Application No. 96110044.3 dated Dec. 19, 1996, 4 pp.
Article entitled "Le Tekmeter THM 565 Tektronix", pp. 19-21 as appeared in Electronique Radio Plans (1994), No. 554, Paris, FR (translation not available).

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