Measurement apparatus and method

Details Measurement apparatus and method Measurement apparatus and method

2011-03-29

2011-03-29

Toatley, Gregory J (Department: 2877)

Optics: measuring and testing

Position or displacement

C356S121000, C356S401000, C356S511000, C365S042000, C365S047000, C365S072000

Reexamination Certificate

active

07916310

ABSTRACT:
A measurement apparatus disclosed that has a radiation source configured to provide a measurement beam of radiation such that an individually controllable element of an array of individually controllable elements capable of modulating a beam of radiation, is illuminated by the measurement beam and redirects the measurement beam, and a detector arranged to receive the redirected measurement beam and determine the position at which the redirected measurement beam is incident upon the detector, the position at which the redirected measurement beam is incident upon the detector being indicative of a characteristic of the individually controllable element.

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Japanese Office Action for Patent Application No. 2007-249522 dated Jul. 27, 2010.

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