Measurement apparatus

Details Measurement apparatus Measurement apparatus

2008-10-08

2010-11-30

Bennett, G. Bradley (Department: 2841)

Geometrical instruments

Distance measuring

Single contact with a work engaging support

C033S813000

Reexamination Certificate

active

07841102

ABSTRACT:
A measurement apparatus for measuring a distance between a base surface and an upper surface of a stepped structure of a workpiece. The measurement apparatus includes a supporting member having an upper surface for supporting the workpiece, a holding member fixed on the top surface, and a micrometer. The holding member includes a reference platform and a depression formed on the reference platform and facing the upper surface. The micrometer is fixed to the holding member and includes an extendable measuring shaft with a contacting portion extending out of the reference platform. The distance is measured by pushing the workpiece into the depression until the base surface make contact with the reference platform.

REFERENCES:
patent: 1416810 (1922-05-01), Foster
patent: 2539597 (1951-01-01), Staples
patent: 2551242 (1951-05-01), Burwinkle
patent: 2686975 (1954-08-01), Geipel
patent: 2766531 (1956-10-01), Egli
patent: 2994963 (1961-08-01), Turner
patent: 3525255 (1970-08-01), Orr, Jr.
patent: 4106240 (1978-08-01), De Bartolo
patent: 4240207 (1980-12-01), Benjamin et al.
patent: 2008/0155846 (2008-07-01), Li et al.

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