Measure-controlled delay circuits with reduced phase error

Details Measure-controlled delay circuits with reduced phase error Measure-controlled delay circuits with reduced phase error

2007-04-24

2007-04-24

Nguyen, Linh My (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

C327S149000

Reexamination Certificate

active

11293634

ABSTRACT:
Measure-controlled delay (MCD) circuits are provided for synchronizing an output clock to an input clock. In response to triggering of a measure circuit, sample circuits sample outputs of a measure delay array. Sample reset logic prevents output of the output clock when any of a predetermined one or more of the samples correspond to a particular logic value (i.e., logic “1” or “0”). For example, sample reset logic may prevent an MCD circuit from providing the output clock when a sample taken from the earliest sampling point of the measure delay array corresponds to logic “1.” The MCD circuit may then provide the output clock in response to a subsequent triggering for which a sample taken from the earliest sampling point is logic “0.” Phase error of the output clock is thereby reduced. Clock synchronization circuits with improved response to process, voltage and temperature (PVT) variations are also provided.

REFERENCES:
patent: 6768361 (2004-07-01), Kwak

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