Measure control delay and method having latching circuit...

Details Measure control delay and method having latching circuit... Measure control delay and method having latching circuit...

2007-09-11

2008-08-05

Richards, N. Drew (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Having specific delay in producing output waveform

C327S264000, C327S285000

Reexamination Certificate

active

07408394

ABSTRACT:
A measure control delay includes a measuring delay line and a signal generating delay line, each of which include a plurality of series-connected delay units. A digital signal is applied to an initial delay unit in the measuring delay line and it sequentially propagates through the delay units until a second digital signal is received. These outputs are applied to control inputs to the signal generating delay line to control the number of delay units through which a clock signal propagates before being output from a final delay unit. Each of the delay units in the measuring delay line includes a pair of series connected NOR gates. A NOR gate to which the digital signal is initially applied is coupled to a second NOR gate as a flip-flop so that the output of the NOR gate remains constant after the digital signal has been applied to the measuring delay line.

REFERENCES:
patent: 5532632 (1996-07-01), Kent
patent: 6172544 (2001-01-01), Sugamori
patent: 6177823 (2001-01-01), Saeki
patent: 6801070 (2004-10-01), Gomm et al.
patent: 7212057 (2007-05-01), Gomm et al.
patent: 7332950 (2008-02-01), Blodgett

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