Means to detect and locate pinching and chafing of conduits

Details Means to detect and locate pinching and chafing of conduits Means to detect and locate pinching and chafing of conduits

1989-05-15

1990-06-19

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Instruments and devices for fault testing

340665, G01R 3108

Patent

active

049356992

ABSTRACT:
A conduit has a core and an axial length susceptible to being pinched and chafed by other structure adjacent the conduit. An inner semiconductive layer extends the length of the conduit susceptible to being pinched and has a reference point adapted to be electrically connected with a detecting circuit for detecting a pinch and/or a computing unit for determining the location of a pinch. A resiliently compressible electrical switching layer, which is nonconducting when not pinched and conducting when pinched, is superposed against the inner semiconductive layer.

REFERENCES:
patent: 3750127 (1973-07-01), Ayers et al.
patent: 3794790 (1974-02-01), Leyland
patent: 4524256 (1985-06-01), Miyata et al.
patent: 4617433 (1986-10-01), Hoshikawa et al.
patent: 4629925 (1986-12-01), Booth et al.

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