Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1987-04-29
1989-10-03
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
048712566
ABSTRACT:
A projector for selectively projecting patterns of light onto a remote object, one use of which is in conjunction with a system to establish measurements of the surface characteristics of the object, the projector including at least one light source and associated lens assembly mounted to project light onto the remote object, and a rotatable mask member having two or more segments, each segment a distinctive optical pattern, which mask can be rotated as to position a selected one of the segments between the light source and the projection lens assembly whereby when light is directed through the selected segment the light projected onto the remote object will be modified by the optical pattern on that segment. The projector may have two or more spaced light sources and associated projection lens assemblies, and the mark rotatable therebetween to produce distinctively different patterns of light impinging on the remote object when the respective light sources are illuminated, the patterns of light projected on the object when a selected mask segment is positioned in the path of one of the light sources when it is illuminated being angularly related to the pattern of images projected on the object when that same segment is positioned between a second light source and second lens and that second light source is illuminated.
REFERENCES:
patent: 3866052 (1975-02-01), DiMatteo et al.
patent: 4187011 (1980-02-01), DiMatteo et al.
patent: 4357108 (1982-11-01), Stern et al.
patent: 4668984 (1987-05-01), Rosenfeld
patent: 4687326 (1987-08-01), Corby
LBP Partnership
Rosenberger Richard A.
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