Means for measuring coplanarity of leads on an IC package

Details Means for measuring coplanarity of leads on an IC package Means for measuring coplanarity of leads on an IC package

1991-07-15

1993-09-28

Moore, David K.

Image analysis

Histogram processing

For setting a threshold

382 47, 358101, 358107, 359710, G06K 900

Patent

active

052492397

ABSTRACT:
A coplanarity measuring apparatus includes an image converting section, an optical lens mechanism, an image processing section, and an arithmetic operating section. The image converting section converts a transmission image of lead end portions of a surface-mount type IC package into image data. The optical lens mechanism vertically enlarges a transmission image, of the lead end portions, which is projected by the image converting section, and horizontally reduces the vertically enlarged transmission image. The image processing section converts the image data output from the image converting section into binary data and forming a profile. The arithmetic operating section calculates a coplanarity from the profile formed by the image processing section and checks whether a product is defective.

REFERENCES:
patent: 4158134 (1979-06-01), Martin et al.
patent: 4277441 (1981-07-01), Sachs
patent: 4696047 (1987-09-01), Christian et al.
patent: 4772125 (1988-09-01), Yoshimura et al.
patent: 4906099 (1990-03-01), Casasent
patent: 5125052 (1992-06-01), Lehureau et al.

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