Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-02-02
1995-08-22
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324767, 324537, 324 731, 371 211, 371 213, G01R 3100
Patent
active
054443903
ABSTRACT:
An apparatus for testing respective electrical components in situ within a circuit having a plurality of the electrical components. A power bus is connected between a power source and switching devices operable for conducting test current to respective ones of the electrical components. A comparator circuit includes inputs connected to the power bus and to a reference potential. A processor is programmed to actuate respective switching devices for causing a test current to be conducted from the power bus through a respective component, while sensing any output signal from the comparator circuit corresponding to an increased potential on the power bus indicative of a reduced current flow caused by an open or failed component. An isolating resistor is connected between the power bus and the power supply, and a bypass switch is connected in parallel with the isolating resistor for bypassing the isolating resistor and conducting operating power directly to the power bus, for operating the circuit when testing is not in progress.
REFERENCES:
patent: 3686661 (1972-08-01), Sharpless
patent: 4728188 (1988-03-01), Kitagawa et al.
patent: 4764728 (1988-08-01), Sato et al.
patent: 5235272 (1993-08-01), Henley
patent: 5276400 (1994-01-01), Denyer et al.
Bartlett Charles E.
Bower, Jr. Robert
Cleaver Brady L.
Smith George C.
Khosravi Kourosh Cyrus
Texas Digital Systems, Inc.
Wieder Kenneth A.
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