Means and method for measuring levels of ionic contamination

Details Means and method for measuring levels of ionic contamination Means and method for measuring levels of ionic contamination

1976-02-17

1977-05-17

Serwin, R.E.

Chemistry: physical processes

Physical processes

Crystallization

23253R, 324 71R, G01N 2706

Patent

active

040239314

ABSTRACT:
A system and method for measuring ionic contamination of an electronic assembly includes the steps of providing a test solution of a known ionic content; placing an electronic assembly of known exposed area into a predetermined static volume of the test solution; thereafter measuring the ionic content of the test solution to provide a measurement of the ionic contamination of said assembly.

REFERENCES:
patent: 3366554 (1968-01-01), Lindblad
patent: 3459505 (1969-08-01), Tweed
patent: 3490873 (1970-01-01), Corl

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