Meandering winding test circuit

Details Meandering winding test circuit Meandering winding test circuit

1996-08-23

1998-08-11

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324202, 32420717, 324230, 324232, 324233, 324243, 324262, 336200, 336206, 336232, G01N 2772, G01N 2782, G01R 3312, G01B 710

Patent

active

057932069

ABSTRACT:
A meandering winding magnetometer (MWM) includes a meandering primary winding and at least one sensing winding or coil on a membrane to be pressed against a test surface. The membrane may be supported on a flexible carrier which is translatable into a probe. Abutments in the probe press the carrier against the test surface but allow the carrier and membrane to conform to the test surface. One MWM circuit includes meandering primary and secondary windings. The return leads from the secondary winding return to connector pads in close alignment with the test array, while leads from the primary winding are spaced at least one wavelength from the array. In another MWM circuit, individual sensing loops are positioned within the meandering primary winding. The MWM circuit may be provided on an adhesive tape which may be cut to length.

REFERENCES:
patent: 3249854 (1966-05-01), Nevius
patent: 3721859 (1973-03-01), Blanyer
patent: 3939404 (1976-02-01), Tait
patent: 4058766 (1977-11-01), Vogel et al.
patent: 4399100 (1983-08-01), Zsolnay et al.
patent: 4423371 (1983-12-01), Senturia et al.
patent: 4496697 (1985-01-01), Zsolnay et al.
patent: 4757259 (1988-07-01), Charpentier
patent: 4799010 (1989-01-01), Muller
patent: 4810966 (1989-03-01), Schmall
patent: 4814690 (1989-03-01), Melcher et al.
patent: 4883264 (1989-11-01), Yoshikawa et al.
patent: 4922201 (1990-05-01), Vernon et al.
patent: 5015951 (1991-05-01), Melcher
patent: 5041785 (1991-08-01), Bogaerts et al.
patent: 5059902 (1991-10-01), Linder
patent: 5086274 (1992-02-01), Gobin et al.
patent: 5182513 (1993-01-01), Young et al.
patent: 5204621 (1993-04-01), Hermann et al.
patent: 5237271 (1993-08-01), Hedengren
patent: 5262722 (1993-11-01), Hedengren et al.
patent: 5315234 (1994-05-01), Sutton, Jr. et al.
patent: 5345514 (1994-09-01), Mahdavich et al.
patent: 5389876 (1995-02-01), Hedengren et al.
patent: 5434504 (1995-07-01), Hollis et al.
patent: 5453689 (1995-09-01), Goldfine et al.
Dodd, V.C. and Deeds, W.E., "Absolute Eddy-Current Measurement of Electrical Conductivity," From Review of Progress in Quantitative Nondestructive Evaluation, vol. 1, 1981, pp. 387-394.
Dodd, C.V. and Simpson, W.A., "Measurement of Small Magnetic Permeability Changes by Eddy Current Techniques," presented at the National Fall Conference of the American Society for Nondestructive Testing, Oct. 19-22, 1970, pp. 217-221.
Rose J.H. and Nair, S.M., "Exact recovery of the DC electrical conductivity of a layered solid," Inverse Problems, Letter to the Editor, 1991, pp. L31-L36.
Auld, B.A. et al., "Eddy-Current Signal Analysis and Inversion for Semielliptical Surface Cracks," Journal of Nondestructive Evaluation, vol., 7, No. 1/2, 1988, pp. 79-84.
Goldfine, Neil et al., "Dielectrometers and magnetometers, suitable for in-situ inspection of ceramic and metallic coated components," SPIE Conference, Jun. 1995, 6 pages.
Goldfine, Neil et al., "A New Eddy-Current Based Technology for Repeatable Residual Stress and Age Degradation Monitoring," ASNT International Chemical and Petroleum Industry Inspection Technology IV, Houston, TX Jun. 19-22, 1995, 3 pages.
Krampfner, Yehuda D. et al., "Flexible Substrate Eddy Current Coil Arrays," Review of Progress in Quantitative Nondestructive Evaluation, vol. 7A, 1988. pp. 461-478.
Zaretsky, M. et al., "Model Approach to Obtaining Continuum Properties From Inter-Digital Electrode Dielectrometry," Massachusetts Institute of Technology, Lees Technical Report, July 1986, pp. 1-43.

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